High speed access for test and in-chip sensor & monitor data throughout the silicon lifecycle. Within the SiliconMAX Platform, High-Speed Access & Test (HSAT) IP plays a critical role enabling ...

Yokogawa said its latest high-voltage, wide-bandwidth probe can stay on top of the faster switching speeds of next-generation ...

TOKYO, Feb. 12, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) ...

February 13 2025, the Defense Advanced Research Projects Agency (DARPA) announced its secretive Aerospace Projects Office ...

For the first high-speed test runs, James added a vacuum-formed shell and a pair of large vertical stabilizers for high-speed stability. On the 3rd test run at a local racetrack, the car got up to ...

TOKYO, Feb. 12, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced the T5801 Ultra-High-Speed DRAM Test System. The cutting ...

The new products are suitable for pin electronics [3] applications in semiconductor testers, which measure devices under test (DUT) with high accuracy and at high speed while switching signals.