Subsequently, scanning electron microscopy can be employed to image the elemental composition of a sample surface and establish topographical sample features with a resolving power that is ...

Through the User Interface, the operator can choose to activate Elemental Mapping or EDX Point Analysis. The NANOS is available with both a Secondary Electron Detector (SED) and a Back Scattered ...

known as the Auger electron. In the Auger process, the energy of these Auger electrons is characteristic of the atomic structure of the element from which they are emitted, allowing for the precise ...

The choice between electron diffraction and XRD depends on the specific requirements of the study, such as the need for high spatial resolution, sensitivity to light elements, or the nature of the ...

The electron microscopes in the main suite are all fitted with digital image capture and energy dispersive X-ray systems for analysis of elemental composition and distribution. The most recent ...